Publication Overview

Thorsten Roth and Martin Weier and André Hinkenjann and Yongmin Li and Philipp Slusallek

An analysis of eye-tracking data in foveated ray tracing

Published in: 2016 IEEE Second Workshop on Eye Tracking and Visualization, ETVIS 2016, Baltimore, MD, USA, October 23, 2016
Year: 2016
Volume: 35
Pages: 69-73