Publication Overview

Vamsi Kiran Adhikarla and Marek Vinkler and Denis Sumin and Rafal K. Mantiuk and Karol Myszkowski and Hans-Peter Seidel and Piotr Didyk

Towards a Quality Metric for Dense Light Fields

Published in: 2017 IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2017, Honolulu, HI, USA, July 21-26, 2017
Year: 2017
Volume: 23
Pages: 3720-3729