Publication Overview

Konstantinos Rematas and Tobias Ritschel and Mario Fritz and Efstratios Gavves and Tinne Tuytelaars

Deep Reflectance Maps

Published in: 2016 IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2016, Las Vegas, NV, USA, June 27-30, 2016
Year: 2016
Volume: 35
Pages: 4508-4516