Publication Overview

Tim Dahmen and Jean-Pierre Baudoin and Andrew R.Lupini and Christian Kübel and Philipp Slusallek and Niels de Jonge

Combined scanning transmission electron microscopy tilt- and focal series.

Published in: Microscopy and Microanalysis: The Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
Year: 2014
Pages: 1–13